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Photo Lithography

  • Projection mask exposure to 2µm feature size
  • Proximity mask exposure to 5µm feature size with capability to align to features on the opposite side of the wafer to an accuracy of +/-5µm (Double Side Align)
  • I-line Stepper photolith to 0.5µm on 150mm wafers only
    • Presently available for Non CMOS applications
    • Available in July 2010 for CMOS compatible processes

Plasma_Etch Diffusion thin Films Deep Reactive Ion Etching Spin on Coatings Wet Chemical Etch Metrology Physical Vapour Disposition (PVD) Dry Isotropic EtchWafer BondingPhoto Lithography
Newark Road South Eastfield Industrial Estate Glenrothes Fife KY7 4NS +44 (0)1592 630630